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TITLE(s): TESTER, WAFER SUBSTRATE (electron. comp.) Tests semiconductor wafer substrate, using testing equipment, such as probe tester, spectophotometer, and curve tracer, to evaluate electrical characteristics of wafer substrate: Places wafer, using tweezers, on test equipment that measures electrical characteristics of wafer substrate, such as resistivity, capacitance, and voltage. Starts equipment and observes equipment readout to determine wafer electrical measurements. Records measurements in production log. Compares measurements with specification sheets to determine if wafer substrate meets company standards. Sorts, boxes, and labels tested wafers. Delivers wafers and process sheets to production line workers. Maintains production records. May inspect wafer substrate surfaces, using ultraviolet lamp, to detect scratches and contamination. GOE: 06.03.02 STRENGTH: L GED: R3 M2 L3 SVP: 4 DLU: 86 ONET CROSSWALK: 83005A Production Inspectors, Testers, Graders, Sorters, Samplers, Weighers |
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TITLE(s):
TESTER, WAFER SUBSTRATE (electron. comp.)
Tests semiconductor wafer substrate, using testing equipment, such as probe tester,
spectophotometer, and curve tracer, to evaluate electrical characteristics of wafer substrate:
Places wafer, using tweezers, on test equipment that measures electrical characteristics of wafer
substrate, such as resistivity, capacitance, and voltage. Starts equipment and observes equipment
readout to determine wafer electrical measurements. Records measurements in production log. Compares
measurements with specification sheets to determine if wafer substrate meets company standards.
Sorts, boxes, and labels tested wafers. Delivers wafers and process sheets to production line
workers. Maintains production records. May inspect wafer substrate surfaces, using ultraviolet lamp,
to detect scratches and contamination.
GOE: 06.03.02 STRENGTH: L GED: R3 M2 L3 SVP: 4 DLU: 86
ONET CROSSWALK: 83005A Production Inspectors, Testers, Graders, Sorters, Samplers, Weighers
© 1995 - 2015 Photius Coutsoukis and Information Technology Associates (All Rights Reserved). Revised 26-May-03