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![]() TITLE(s): TESTER, SEMICONDUCTOR WAFERS (electron. comp.) Tests electrical characteristics of circuits on semiconductor wafers, using test equipment: Reads processing documents to determine test specifications. Obtains specified probe cards from inventory and slides probe cards into designated slot on testing equipment. Activates testing equipment and places wafer on chuck of test equipment, using tweezers. Observes wafer through test equipment microscope and aligns wafer under probes of test equipment. Pushes buttons to activate test cycle. Records test readings from printouts or display screen in test log. Compares test readings with specifications manual to identify wafers failing electrical tests. Maintains production records. May clean and maintain test equipment. GOE: 06.03.02 STRENGTH: S GED: R2 M2 L2 SVP: 3 DLU: 86 ONET CROSSWALK: 83005A Production Inspectors, Testers, Graders, Sorters, Samplers, Weighers |
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TITLE(s):
TESTER, SEMICONDUCTOR WAFERS (electron. comp.)
Tests electrical characteristics of circuits on semiconductor wafers, using test equipment: Reads
processing documents to determine test specifications. Obtains specified probe cards from inventory
and slides probe cards into designated slot on testing equipment. Activates testing equipment and
places wafer on chuck of test equipment, using tweezers. Observes wafer through test equipment
microscope and aligns wafer under probes of test equipment. Pushes buttons to activate test cycle.
Records test readings from printouts or display screen in test log. Compares test readings with
specifications manual to identify wafers failing electrical tests. Maintains production records. May
clean and maintain test equipment.
GOE: 06.03.02 STRENGTH: S GED: R2 M2 L2 SVP: 3 DLU: 86
ONET CROSSWALK: 83005A Production Inspectors, Testers, Graders, Sorters, Samplers, Weighers
© 1995 - 2015 Photius Coutsoukis and Information Technology Associates (All Rights Reserved). Revised 26-May-03