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TITLE(s): REPAIRER, PROBE TEST CARD, SEMICONDUCTOR WAFERS (electron. comp.) Replaces and realigns broken, worn, or misaligned probes on probe test cards, using handtools and equipment, to maintain probe cards for wafer probe (electrical test) equipment: Reads specification sheets, manuals, and diagrams to determine probe card wiring and probe positions. Inspects probe cards, using microscope, to detect defects, such as loose wiring and loose, split, or worn probes. Removes, replaces, and re-solders defective wiring and probes, using tweezers and soldering iron. Observes probe card through microscope and aligns probes in specified position over test wafer, using tweezers. Aligns probes on even plane, using tweezers and test equipment. Maintains repair and replacement records. Maintains probe and inventory records, using computer terminal. GOE: 06.01.04 STRENGTH: L GED: R3 M2 L2 SVP: 4 DLU: 86 ONET CROSSWALK: 85717B Test Card and Circuit Board Repairers |
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TITLE(s):
REPAIRER, PROBE TEST CARD, SEMICONDUCTOR WAFERS (electron. comp.)
Replaces and realigns broken, worn, or misaligned probes on probe test cards, using handtools and
equipment, to maintain probe cards for wafer probe (electrical test) equipment: Reads specification
sheets, manuals, and diagrams to determine probe card wiring and probe positions. Inspects probe
cards, using microscope, to detect defects, such as loose wiring and loose, split, or worn probes.
Removes, replaces, and re-solders defective wiring and probes, using tweezers and soldering iron.
Observes probe card through microscope and aligns probes in specified position over test wafer,
using tweezers. Aligns probes on even plane, using tweezers and test equipment. Maintains repair and
replacement records. Maintains probe and inventory records, using computer terminal.
GOE: 06.01.04 STRENGTH: L GED: R3 M2 L2 SVP: 4 DLU: 86
ONET CROSSWALK: 85717B Test Card and Circuit Board Repairers
© 1995 - 2015 Photius Coutsoukis and Information Technology Associates (All Rights Reserved). Revised 26-May-03